Two-way material transportation method based on 300mm wafer FAB line simulation.
Youngshin HanChilgee LeePublished in: SpringSim (2010)
Keyphrases
- detection method
- high accuracy
- computational complexity
- mathematical model
- clustering method
- classification accuracy
- computational cost
- cross section
- theoretical analysis
- learning algorithm
- cost function
- significant improvement
- prior knowledge
- pairwise
- experimental evaluation
- dynamic programming
- edge detection
- feature space
- synthetic data
- preprocessing
- classification method
- fully automatic
- feature selection