Write-through method for embedded memory with compression Scan-based testing.
Geewhun SeokHong KimBaker MohammadPublished in: VTS (2012)
Keyphrases
- high accuracy
- experimental evaluation
- pairwise
- cost function
- dynamic programming
- objective function
- test data
- detection method
- computational cost
- computationally efficient
- memory usage
- feature selection
- classification method
- similarity measure
- classification accuracy
- probabilistic model
- support vector machine svm
- clustering method
- prior knowledge
- training set
- preprocessing