Write-through method for embedded memory with compression Scan-based testing.

Geewhun Seok Hong Kim Baker Mohammad

Published in: VTS (2012)

Keyphrases

high accuracy
experimental evaluation
pairwise
cost function
dynamic programming
objective function

test data
detection method
computational cost
computationally efficient
memory usage

feature selection
classification method
similarity measure
classification accuracy
probabilistic model

support vector machine svm
clustering method
prior knowledge
training set
preprocessing