Compact Modeling of the p-i-n Diode Reverse Recovery Effect Valid for both Low and High Current-Density Conditions.
Masataka MiyakeJunichi NakashimaMitiko Miura-MattauschPublished in: IEICE Trans. Electron. (2012)
Keyphrases
- high levels
- image processing
- wide range
- sufficient conditions
- artificial intelligence
- website
- environmental conditions
- computer simulation
- recovery algorithm
- high noise
- image recovery
- low signal to noise ratio
- high dimension
- significantly lower
- modeling framework
- small size
- high precision
- real time
- multiresolution
- genetic algorithm
- information retrieval
- databases
- data sets