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DFT Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs.

Osamu HirabayashiAzuma SuzukiTomoaki YabeAtsushi KawasumiYasuhisa TakeyamaKeiichi KushidaAkihito TohataNobuaki Otsuka
Published in: ITC (2002)
Keyphrases
  • high speed
  • low power
  • real time
  • databases
  • case study
  • multi agent
  • test cases
  • high speed networks
  • multiscale
  • search algorithm
  • lower level
  • levels of abstraction