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Defect Detection in Transparent Printed Electronics Using Learning-Based Optical Inspection.

Ahmet Turan ErozanSimon BosseMehdi B. Tahoori
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2021)
Keyphrases
  • defect detection
  • learning algorithm
  • reinforcement learning
  • data sets
  • learning process
  • knowledge acquisition
  • active learning
  • learning systems
  • incremental learning
  • decision trees
  • supervised learning