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Mixed supervision model applied to industrial defect detection with mask convolutional enhancement.
Zikang Wang
Jinzheng Lu
Mingcan Chen
Weidong Tan
Published in:
CISP-BMEI (2023)
Keyphrases
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computational model
probabilistic model
mathematical model
experimental data
defect detection
database
probability distribution
parameter estimation
neural network
information retrieval
knowledge base
evolutionary algorithm
statistical model
formal model