Analog Circuit Testing Using Auto Regressive Moving Average Models.

Jeffrey Ayres Michael L. Bushnell

Published in: VLSI Design (2007)

Keyphrases

moving average
autoregressive
non stationary
random fields
arima model
exponential smoothing
arma model
machine learning
analog circuits
feature selection
knowledge base
multiscale
feature vectors
probabilistic model
dynamical model
autoregressive moving average