Deep Just-In-Time Defect Localization.

Fangcheng Qiu Zhipeng Gao Xin Xia David Lo John C. Grundy Xinyu Wang

Published in: IEEE Trans. Software Eng. (2022)

Keyphrases

object localization
accurate localization
information systems
clustering algorithm
deep learning
defect detection
optic disc
databases
artificial intelligence
case study
database systems
special case
activity detection