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Isotropic-Resolution Tomographic Diffractive Microscopy.
Matthieu Debailleul
Mounir Houkal
Carole Ecoffet
Jonathan Bailleul
Joel Lambert
Arnaud Spangenberg
Hui Liu
Olivier Soppera
Olivier Haeberlé
Published in:
ICTON (2018)
Keyphrases
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high resolution
electron microscopy
low resolution
image analysis
consequence finding
input image
image enhancement
conflict detection
neural network
image reconstruction
higher resolution
fluorescence microscopy