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Voltage-comparator-based measurement of equivalently sampled substrate noise waveforms in mixed-signal integrated circuits.
Keiko Makie-Fukuda
Takanobu Anbo
Toshiro Tsukada
Tatsuji Matsuura
Masao Hotta
Published in:
IEEE J. Solid State Circuits (1996)
Keyphrases
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integrated circuit
mixed signal
low voltage
vlsi circuits
low power
measurement error
signal to noise ratio
low cost
high speed