A Method to Model Statistical Path Delays for Accurate Defect Coverage.
Pavan Kumar JavvajiSpyros TragoudasPublished in: DFT (2018)
Keyphrases
- probabilistic model
- mathematical model
- evaluation method
- statistical information
- statistical model
- theoretical analysis
- objective function
- cost function
- high accuracy
- linear model
- sensitivity analysis
- high order
- computationally efficient
- high precision
- regression analysis
- parameter estimation
- extreme value theory
- statistical approaches
- gaussian distribution
- highly accurate
- bp neural network
- hybrid method
- evaluation model
- preprocessing
- pairwise
- prior knowledge
- statistical models
- optimal path
- energy function
- modeling method
- study proposes
- goodness of fit
- analytical model
- autoregressive
- bayesian framework
- network model
- detection method
- test data
- statistical methods
- optimization method
- optimization model
- similarity measure
- completely automatic
- probability distribution
- regression model
- reconstruction method
- monte carlo simulation
- prior information
- feature selection
- markov model
- linear regression
- prediction model
- hybrid model