Login / Signup

Study of MOSFET thermal stability with TSV in operation temperature using novel 3D-LSI stress analysis.

Hideki KitadaHiroko TashiroShoichi MiyaharaTakeshi IshitsukaAki DoteShinji TadakiTatsumi NakadaSeiki Sakuyama
Published in: 3DIC (2016)
Keyphrases
  • statistical analysis
  • infrared
  • qualitative analysis
  • neural network
  • information systems
  • empirical studies
  • quantitative analysis
  • power plant
  • empirical analysis
  • finite element analysis