Special issue on computer analysis of images and patterns.
Pedro RealWalter G. KropatschPublished in: Pattern Recognit. Lett. (2013)
Keyphrases
- special issue
- image analysis
- image data
- ai edam
- international journal
- image retrieval
- input image
- ecml pkdd
- image database
- applied intelligence
- lighting conditions
- edge detection
- ground truth
- object recognition
- image registration
- image features
- segmentation algorithm
- special section
- repetitive patterns
- machine learning
- segmentation method
- image matching
- data analysis
- image collections
- video sequences
- similarity measure
- image segmentation