Binary Linear ECCs Optimized for Bit Inversion in Memories with Asymmetric Error Probabilities.
Valentin GhermanSamuel EvainBastien GiraudPublished in: DATE (2020)
Keyphrases
- linear complexity
- shift register
- logical operations
- binary representation
- laplace transform
- gray code
- feature selection
- minimum error
- error analysis
- error tolerance
- error rate
- probability distribution
- integer arithmetic
- binary classifiers
- error propagation
- relative error
- hamming distance
- error correcting codes
- belief networks
- closed form
- binary valued
- feature space
- data sets