Login / Signup
Impact of Single Event Upset on Voltage and Current Behaviors of CNTFET SRAM and a Comparison with CMOS SRAM.
T. R. Rajalakshmi
R. Sudhakar
Published in:
J. Circuits Syst. Comput. (2017)
Keyphrases
</>
low voltage
random access memory
power consumption
leakage current
low power
design considerations
power management
cmos technology
high speed
data transmission
power supply
neural network
power system