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Fault Injection for Test-Driven Development of Robust SoC Firmware.
Petra R. Maier
Veit B. Kleeberger
Daniel Mueller-Gritschneder
Ulf Schlichtmann
Published in:
ACM Trans. Embed. Comput. Syst. (2018)
Keyphrases
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fault injection
power consumption
low cost
software development
end to end
embedded systems
fault model
test driven development