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Fault Injection for Test-Driven Development of Robust SoC Firmware.

Petra R. MaierVeit B. KleebergerDaniel Mueller-GritschnederUlf Schlichtmann
Published in: ACM Trans. Embed. Comput. Syst. (2018)
Keyphrases
  • fault injection
  • power consumption
  • low cost
  • software development
  • end to end
  • embedded systems
  • fault model
  • test driven development