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Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification.

Takahiro MatsudaYoshiaki NishikawaEiji TakahashiTakeo OnishiToshiki Takeuchi
Published in: IEEE Access (2023)
Keyphrases
  • learning objects
  • real world
  • dynamic environments
  • metadata
  • multi class
  • production system
  • robotic systems
  • multipath
  • non binary
  • manufacturing process