Sign in

RowPress: Amplifying Read Disturbance in Modern DRAM Chips.

Haocong LuoAtaberk OlgunAbdullah Giray YaglikçiYahya Can TugrulSteve RhynerMeryem Banu CavlakJoël LindeggerMohammad SadrosadatiOnur Mutlu
Published in: ISCA (2023)
Keyphrases
  • high density
  • integrated circuit
  • main memory
  • high speed
  • data sets
  • data center
  • low voltage
  • neural network
  • high end
  • read write
  • computer systems
  • design considerations