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Impact of gate drive voltage on avalanche robustness of trench IGBTs.

Michele RiccioLuca MarescaAndrea IraceGiovanni BreglioYohei Iwahashi
Published in: Microelectron. Reliab. (2014)
Keyphrases
  • field effect transistors
  • computational efficiency
  • factors that influence
  • artificial intelligence
  • databases
  • case study
  • multiscale
  • power system
  • power supply
  • high impact
  • high voltage