Login / Signup
A Novel Test Application Scheme for High Transition Fault Coverage and Low Test Cost.
Zhen Chen
Dong Xiang
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2010)
Keyphrases
</>
decision support
neural network
information retrieval
case study
database systems
conducted an empirical study
test cases
high cost
small size