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Design of Testable VLSI Circuits with Minumum Area Overhead.
Prasad R. Chalasani
Sudipta Bhawmik
Anurag Acharya
Parimal Pal Chaudhuri
Published in:
IEEE Trans. Computers (1989)
Keyphrases
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vlsi circuits
case study
real time
image processing
pattern recognition
low power