Login / Signup

Automatic diagnosis of single fault in interconnect testing of SRAM-based FPGA.

T. NirmalrajS. RadhakrishnanS. K. Pandiyan
Published in: IET Comput. Digit. Tech. (2021)
Keyphrases
  • automatic diagnosis
  • high speed
  • early detection
  • low cost
  • signal processing
  • hardware implementation
  • image data
  • fault diagnosis
  • power consumption
  • image analysis
  • low power
  • spect images