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Automatic Verification of Mixed-Signal ATE Test Programs using Device Variation.

Franziska MayerChristian SchottEnrico BillichSaeid YazdaniUlrich HeinkelGeorg DalerBernhard RufRicardo PannuzzoWolfgang Dickenscheid
Published in: ITC (2021)
Keyphrases
  • mixed signal
  • low power
  • vlsi circuits
  • image processing
  • high speed
  • test cases
  • stereo images