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Testing and Reconfiguration of VLSI Linear Arrays.
Roberto De Prisco
Angelo Monti
Linda Pagli
Published in:
Theor. Comput. Sci. (1998)
Keyphrases
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signal processing
vlsi design
image sequences
linear systems
neural network
machine learning
artificial intelligence
feature selection
bayesian networks
multiscale
test data
closed form
software testing
linear complexity