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Oversampled A/D conversion and error-rate dependence of nonbandlimited signals with finite rate of innovation.
Ivana Jovanovic
Baltasar Beferull-Lozano
Published in:
IEEE Trans. Signal Process. (2006)
Keyphrases
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error rate
rejection rate
test set
signal processing
estimation error
case study
lower error rates
optimal solution
cost sensitive classification
false discovery rate
data sets
recognition rate
training error
expected loss