Advanced TSV filling method with Sn alloy and its reliability.
Young-Ki KoMyong-Suk KangHiroyuki KokawaYutaka S. SatoSehoon YooChang-Woo LeePublished in: 3DIC (2011)
Keyphrases
- high accuracy
- error rate
- main contribution
- computational cost
- segmentation method
- preprocessing
- support vector machine svm
- fully automatic
- detection method
- optimization algorithm
- computationally efficient
- mutual information
- edge detection
- experimental evaluation
- high resolution
- objective function
- probabilistic model
- cost function
- significant improvement
- theoretical analysis
- evolutionary algorithm
- computational complexity
- bayesian networks
- synthetic data
- similarity measure
- high precision
- machine learning