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A Bayesian-Based EDA Tool for Nano-circuits Reliability Calculations.

Walid IbrahimValeriu Beiu
Published in: NanoNet (2009)
Keyphrases
  • software tools
  • posterior distribution
  • bayesian learning
  • bayesian networks
  • information systems
  • knowledge base
  • simulated annealing
  • fault diagnosis
  • bayesian inference
  • analog circuits
  • bayesian analysis
  • nano scale