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An optimized through-via bottom-up method for simultaneous-filling TSVS of different aspect-ratios and its potential application on high-frequency passive interposer.

Weibo ZhangJiebin GuGaowei XuLe LuoXinxin Li
Published in: Microelectron. J. (2020)
Keyphrases
  • high frequency
  • high frequency components
  • multi resolution analysis
  • similarity measure
  • multiresolution
  • high resolution
  • wavelet transform
  • edge detection
  • subband