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Review: Countdown Y2K; Peter de Jager, Richard Bergeon. John Wiley & Sons, Inc. ISBN: 0-471-32734-4.

Robert S. Ledley
Published in: Comput. Lang. (1999)
Keyphrases
  • john mccarthy
  • information technology
  • literature review
  • neural network
  • relevant literature
  • case study
  • cooperative
  • pattern recognition
  • viewpoint
  • input image
  • current status