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Cross-cell interference variability aware model of fully planar NAND Flash memory including line edge roughness.

Pavel PoliakovPieter BlommeMiguel CorbalanJan Van HoudtWim Dehaene
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • high level
  • relational databases
  • data sets
  • neural network
  • management system
  • general purpose
  • flash memory