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The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress.
Gang-Jun Kim
Moonjee Yoon
SungHwan Kim
Myeongkyu Eo
Shinhyung Kim
Taehun You
Namhyun Lee
Kijin Kim
Sangwoo Pae
Published in:
IRPS (2021)
Keyphrases
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integrated circuit
power consumption
low power
arc consistency
circuit design
search algorithm
high density
case study
expert systems
exact penalty
axiomatic characterization