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The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress.

Gang-Jun KimMoonjee YoonSungHwan KimMyeongkyu EoShinhyung KimTaehun YouNamhyun LeeKijin KimSangwoo Pae
Published in: IRPS (2021)
Keyphrases
  • integrated circuit
  • power consumption
  • low power
  • arc consistency
  • circuit design
  • search algorithm
  • high density
  • case study
  • expert systems
  • exact penalty
  • axiomatic characterization