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Determination of Voltage Dependence in High-Voltage Standard Capacitors.

Daniel SlomovitzMarcelo BrehmDaniel IzquierdoCarlos FaverioJose Luis CasaisMarcelo H. Cazabat
Published in: IEEE Trans. Instrum. Meas. (2019)
Keyphrases
  • high voltage
  • operating conditions
  • normal operation
  • partial discharge
  • neural network
  • fault diagnosis
  • augmented naive bayes
  • feature space
  • genetic programming
  • short circuit