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Low-Transition Test Pattern Generation for BIST-Based Applications.

Mehrdad NouraniMohammad TehranipoorNisar Ahmed
Published in: IEEE Trans. Computers (2008)
Keyphrases
  • neural network
  • information systems
  • training data
  • significantly lower
  • real time
  • high level
  • bayesian networks
  • data structure
  • cooperative
  • recommender systems
  • multiresolution
  • high levels
  • low signal to noise ratio