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Low-Transition Test Pattern Generation for BIST-Based Applications.
Mehrdad Nourani
Mohammad Tehranipoor
Nisar Ahmed
Published in:
IEEE Trans. Computers (2008)
Keyphrases
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neural network
information systems
training data
significantly lower
real time
high level
bayesian networks
data structure
cooperative
recommender systems
multiresolution
high levels
low signal to noise ratio