High temperature reliability of μtrench Phase-Change Memory devices.

Gabriele Navarro Sarra Souiki Alain Persico Veronique Sousa ean-François Nodin Carine Jahan François Aussenac Vincent Delaye Olga Cueto Luca Perniola Barbara De Salvo

Published in: Microelectron. Reliab. (2012)

Keyphrases