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Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics.
Daniele Felici
Sandro Bonacini
Marco Ottavi
Published in:
DFTS (2015)
Keyphrases
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low power
reed solomon
error correction
cmos technology
power consumption
low cost
high speed
nm technology
error control
distributed video coding
unequal error protection
image processing
base layer
turbo codes
low complexity
power dissipation
error detection
bitstream
information theoretic
real time