Design Rule Violation Prediction at Sub-10-nm Process Nodes Using Customized Convolutional Networks.
Rongjian LiangHua XiangDiwesh PandeyLakshmi N. ReddyShyam RamjiGi-Joon NamJiang HuPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)