A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller.
Swapnil BahlPublished in: MTDT (2004)
Keyphrases
- computationally efficient
- computational cost
- recently developed
- significant improvement
- test data
- software testing
- computational efficiency
- data structure
- computational complexity
- theoretical analysis
- high accuracy
- matlab simulation
- classification algorithm
- dynamic programming
- high speed
- learning algorithm
- neural network
- convergence rate
- search methods
- segmentation method
- mathematical model
- pairwise
- preprocessing
- objective function
- combinatorial optimization
- face recognition
- clustering method
- highly efficient
- optimization algorithm
- cost function