Analysis of Resistive Bridging Defects in a Synchronizer.

Hyoung-Kook Kim Wen-Ben Jone Laung-Terng Wang Shianling Wu

Published in: Asian Test Symposium (2009)

Keyphrases

information retrieval
information systems
decision making
data analysis
image analysis
automatic analysis
computer vision
e learning
image sequences
wide range
data structure
learning environment
support vector