Low Power Memory Built in Self Test Address Generator Using Clock Controlled Linear Feedback Shift Registers.
K. Murali KrishnaM. SailajaPublished in: J. Electron. Test. (2014)
Keyphrases
- low power
- power consumption
- high speed
- low cost
- power dissipation
- high power
- single chip
- low power consumption
- power saving
- cmos technology
- digital signal processing
- vlsi architecture
- vlsi circuits
- real time
- power reduction
- gate array
- logic circuits
- image sensor
- signal processing
- delay insensitive
- nm technology
- built in self test