Predicting AFM Topography from Optical Microscope Images Using Deep-Learning.

Jaewoo Jeong Taeyeong Kim Bong Jae Lee Jungchul Lee

Published in: Adv. Intell. Syst. (2023)

Keyphrases

deep learning
microscope images
cross sections
unsupervised learning
automatic segmentation
mental models
machine learning
scale invariant
weakly supervised
cell nuclei
multiscale
pairwise
text classification