Polynomial Identity Testing for Depth 3 Circuits

Neeraj Kayal Nitin Saxena

Published in: Electron. Colloquium Comput. Complex. (2005)

Keyphrases

software testing
search engine
expert systems
data mining
machine learning
depth map
depth information
circuit design
artificial intelligence
image sequences
video sequences
high speed
multi view
depth images
test suite
lateral inhibition