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TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement.
Benyuan Zhu
E. M. Bazizi
J. H. M. Tng
Z. Li
E. K. Banghart
M. K. Hassan
Y. Hu
D. Zhou
D. Choi
L. Qin
Xuan Wan
Published in:
IRPS (2019)
Keyphrases
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human computer interaction
reliability assessment
total energy
simulation model
human factors
power consumption
simulation environment
neural network
mobile applications
highly reliable
human computer interactions