Toward a Full Probability Model of Edges in Natural Images.
Kim Steenstrup PedersenAnn B. LeePublished in: ECCV (1) (2002)
Keyphrases
- natural images
- probability model
- statistical model
- higher order
- natural scenes
- denoising
- object recognition
- multiscale
- probability distribution
- image denoising
- wavelet transform coefficients
- input image
- receptive fields
- bit plane
- test images
- image statistics
- sparse coding
- edge information
- image patches
- statistics of natural images
- scale invariant
- compressed sensing
- power spectrum
- visual cortex
- saliency map
- natural image patches
- natural image statistics
- image structure