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NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations.
Sharifah Wan Muhamad Hatta
Norhayati Soin
D. Abd Hadi
Jianfu Zhang
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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real time
information retrieval
decision trees
case study
multi agent
data structure