Login / Signup

Geometric design for ultra-long needle probe card for digital light processing wafer testing.

Hao-Yuan ChangWen-Fung PanMeng-Kai ShihYi-Shao Lai
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • design process
  • real time
  • user interface
  • case study
  • low cost
  • information processing
  • embedded systems
  • circuit design
  • three dimensional
  • high speed
  • data processing
  • smart card
  • design tools
  • product design