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A delay metric for RC circuits based on the Weibull distribution.
Frank Liu
Chandramouli V. Kashyap
Charles J. Alpert
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2004)
Keyphrases
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weibull distribution
power dissipation
image intensity
probability density function
high speed
floating point
distance measure
low power
feature extraction
dimensionality reduction
markov random field
power consumption