Algorithms and Software Tools for IC Yield Optimization Based on Fundamental Fabrication Parameters.
M. A. StyblinskiLeszek J. OpalskiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1986)
Keyphrases
- software tools
- optimization problems
- theoretical analysis
- optimization algorithm
- data structure
- parameter tuning
- orders of magnitude
- vantage points
- discrete optimization
- high density
- integrated circuit
- times faster
- significant improvement
- neural network
- benchmark datasets
- optimization methods
- particle swarm optimization
- learning objects
- computational complexity
- parameter optimization
- evolutionary strategy
- search algorithm
- stochastic gradient
- learning algorithm