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Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays.
Carmine Miccoli
Giovanni M. Paolucci
Christian Monzio Compagnoni
Alessandro S. Spinelli
Akira Goda
Published in:
IRPS (2015)
Keyphrases
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disk drives
flash memory
sufficient conditions
noisy data
noise level
pattern matching
low light
pattern discovery
gaussian noise
arbitrary shape
data sets
missing data
noisy images
associative memory
input data
uniformly distributed
multiscale
simplex method
pattern detection
read write
decision trees
linear array