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Improved Perturbation Vector Generation Method for Accurate SRAM Yield Estimation.
Woong Choi
Jongsun Park
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
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generation method
accurate estimation
power consumption
high accuracy
error analysis
high quality
information systems
computationally efficient
parameter estimation
neural network
three dimensional
feature vectors
low cost
robust estimation
vector data