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Reliability of AlGaN/GaN HEMTs: Permanent leakage current increase and output current drop.
Denis Marcon
John Viaene
Paola Favia
Hugo Bender
Xuanwu Kang
Silvia Lenci
Steve Stoffels
Stefaan Decoutere
Published in:
Microelectron. Reliab. (2012)
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